Real Time Observation of Reflectance Anisotropy and Reflection High-Energy Electron Diffraction Intensity Oscillations During Gas-Source Molecular-Beam-Epitaxy Growth of Si and SiG...

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Bibliographic Details

Journal Title:	Physical Review Letters
Authors and Corporations:	Turner, A. R., Pemble, M. E., Fernández, J. M., Joyce, B. A., Zhang, J., Taylor, A. G.
In:	Physical Review Letters, 74, 1995, 16, p. 3213-3216
Media Type:	E-Article
Language:	English
published:	American Physical Society (APS)