TY - JOUR TI - Real Time Observation of Reflectance Anisotropy and Reflection High-Energy Electron Diffraction Intensity Oscillations During Gas-Source Molecular-Beam-Epitaxy Growth of Si and SiGe on Si(001) T2 - Physical Review Letters VL - 74 IS - 16 SP - 3213 EP - 3216 AU - Turner, A. R. and Pemble, M. E. and Fernández, J. M. and Joyce, B. A. and Zhang, J. and Taylor, A. G. PB - American Physical Society (APS) PY - 1995 PY - 1995 LA - English KW - General Physics and Astronomy SN - 1079-7114 SN - 0031-9007 UR - http://dx.doi.org/10.1103/physrevlett.74.3213 UR - https://katalog.bibliothek.tu-chemnitz.de/Record/ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTEwMy9waHlzcmV2bGV0dC43NC4zMjEz ER -